Accordingly, the memory test control circuit allows pass-through of memory data and control signals directly to the memory blocks during test mode, and provides the memory data and control signals to the logic block during normal operations. The memory test control circuit transmits the memory control signals and the memory data signals to the first and second memories when the first and second memories are tested and transmits the memory control signals and the memory data signals to the logic block during normal operation of the MML integrated circuit. The memory test control circuit is also connected to the logic block and to the first and second memories. The memory test control circuit is also connected to a second pad which receives memory data signals for the first and second memories. ![]() The memory test control circuit is connected to a first pad which receives memory control signals to control first and second memories of the MML circuit. These and other objects are provided, according to the present invention, by providing a memory test control circuit in an MML integrated circuit. It is another object of the present invention to provide testing methods and circuits for MML integrated circuits that can reduce the number of additional pads that are used for memory testing. It is therefore an object of the present invention to provide improved testing circuits and methods for MML integrated circuits. Unfortunately, the addition of large numbers of test pads may increase the cost, size and/or complexity of the MML integrated circuit. Accordingly, additional pads may be needed to test the memory of the MML integrated circuit. However, the memory block in an MML integrated circuit may be difficult to test because the memory is connected to the external pads through the logic block. Stated differently, in order to test a conventional memory integrated circuit, test equipment is connected to the pads of the memory integrated circuit. Since many of these internal pads are not brought out to external MML integrated circuit pads, it may be difficult to access all of the internal data pads in order to test the memory block. For example, up to 256 or more internal pads may be provided. ![]() In particular, the MML integrated circuit generally provides a large number of internal data pads between the memory block and the logic block. MML integrated circuits present new challenges for the testing thereof. ![]() Thus, an MML integrated circuit can replace discrete memory and logic chips that are used in personal computers and other consumer and commercial devices. The logic block may also be referred to as a “logic circuit” or simply as a “logic”. The large capacity memory is generally divided into a plurality of memory blocks, also referred to as “memories”. MML integrated circuits generally include a large capacity memory and a large logic block that are merged in one integrated circuit. Recently, merged memory and logic (MML) integrated circuits have been developed. Integrated circuit devices, such as integrated circuit memory devices and integrated circuit logic devices, are widely used in consumer and commercial applications. This invention relates to integrated circuit devices, and more particularly to testing of integrated circuit devices.
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